Lunam™ T- 40i – Force sensor module

Impetux’s exclusive, patented technology leads you where other force methods cannot. Our products represent a breakthrough in how optical trapping forces are measured; enabling and making simple unprecedented experiments where traditional trap stiffness calibration fails.

Main features:

  • Force measurements inside viscoelastic materials like living cells or 3D tissues.
  • Direct force measurements: No need to track sample position to measure forces.
  • Calibration-free: No prior calibration of trap stiffness is ever required to measure forces.
  • Synchronised with the optical manipulation module Cygnium™G-422, it allows simultaneous force measurements for multiple independent traps (visit SENSOCELL™product page).
  • 3D force measurements: module for z-force component available on demand.
  • Accurate determination of sample position.
  • Laser power at the sample and ambient temperature are provided by the sensor.
  • Easy installation and operation.
  • User-friendly control software interface.

Our unique force sensor technology also allows:

  • Measuring forces exerted on non-spherical objects.
  • Measuring forces beyond the region of linear proportionality between force and sample position.
  • Accurate force measurements for customers working with non-Gaussian beams or multiple permanent traps.
  • Furthermore, the Lunam™T-40i can also work as a classic back focal plane interferometry sensor.

Request a quote or

contact us for more information.

The Lunam™T-40i can be installed and set in operation through a simple procedure even by non-expert users. Check the videos below for instrument installation and height adjustment. To see the Lunam™T-40i in action check the video demonstration in the SENSOCELL™ product page.

The Lunam™T-40i substitutes the illumination condenser, without changing the imaging capabilities of the microscope. It can be installed by a single user without any required expertise in a short time.

Adjustment of the sensor height is straightforward thanks to the integrated iris used as reference.

Force Sensor Technology

The key of our technology is that our systems measure the force as a derived magnitude of the direction of propagation (momentum) of the laser trapping beam. The analysis of laser trapping light momentum changes provides a direct route to the force. Hence, unlike other force sensors based on back focal plane interferometry, the Lunam™T-40i allows measuring forces without requiring any sample position tracking or any previous trap stiffness calibration. This gives our technology a key advantage for measuring forces in complex media like cells or biological tissues since no restrictions on the sample are imposed.

All our systems have been designed with the utmost quality in mind. High reproducibility in the results is provided thanks to the implementation of systematic routines in the operation of the force sensor. The sensors incorporate immersion optics for maximum signal sensitivity, especially when working with small samples or at low powers. The integrated analog and digital electronics, featuring high-resolution A/D converters ensure acquisition fidelity. A careful design guarantees mechanical stability and easy installation.

Technical Specifications

  • Dual measurement mode: position calibration through back-plane interferometry and detection of light momentum for single movable traps.
  • Compact, symmetric opto-mechanical design, compatible with the illumination columns T-DH and TI-DH of Nikon microscopes (TE2000, Ti and Ti-2 models). To check availability for other microscope models or manufacturers, contact us.
  • Straightforward installation and tuning routines ensure correct measurements and reproducibility (eyepiece with Bertrand lens incorporated or Centering Scope required).
  • High Numerical-Aperture (NA=1.4) immersion optics. Optical design optimized for λ=1064 nm.
  • Maximum laser power at the sample: 300 mW  (Check with us different power ranges to fit your needs).
  • Force resolution <50 fN.
  • Position resolution <1 nm (typ.).
  • Integrated sensor noise over the whole bandwidth <0.1 pN (typ.).
  • Temperature-compensated, duo-lateral position sensitive detector (PSD) (max. sampling frequency 100 kHz).
  • Up to 100 kHz, 18-bit, analog-to-digital conversion.
  • Direct PC communication through Hi-speed USB 2.0 port.
  • Highly-regulated, low-noise linear power supply (models with 100/120/220/240 VAC- 50/60 Hz available).
  • Acquisition software and LabVIEW libraries included.
  • Dimensions of the sensor head (L x H x W): 22 x 18  x 11 cm.

Contact us:

impetux@impetux.com

(+34) 93 185 69 38

Visit us:

Carrer Trias i Giró 15, 1-5 | 08034 Barcelona

 Location

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